Description: Leeb Hardness Tester C Type Impact Device For Smaller Thin Compone NDT Test
Price: 150.3 USD
Location: 合肥
End Time: 2023-12-11T07:16:12.000Z
Shipping Cost: 0 USD
Product Images
Item Specifics
Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money back or replacement (buyer's choice)
Country/Region of Manufacture: China
Type: C Type Impact Device
MPN: C Type Impact Device
Brand: VTSYIQI
